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 MDM X-Profiler is available to Exeros partners only (it is not available for end users) and provides the source data discovery subset of features of our full featured Exeros Discovery product. MDM X-Profiler is focused on providing our partners the maximum cross-source data analysis value with a minimal amount of web based training.
MDM X-Profiler is designed to work specifically in an MDM deployment for the up front source data discovery phase of a project. We have taken the methodology and best practices applied by our consultants using Exeros Discovery for MDM deployments and codified the methodology directly into the software. The result is a data analysis and discovery product that performs cross-system profiling for multiple data sources (up to 20 simultaneously).
MDM X-Profiler provides data analysis functionality and a methodology specifically for the MDM source rationalization process:
- Cross-source data analysis to discover attribute supersets and subsets
- Cross-source data analysis to identify overlapping and unique attributes
- Complete profiling capabilities to analyze individual data sources
- Discovery of primary-foreign keys and orphaned rows
- Interactive previewing and comparison of record values within and between different data sources
side-by-side
- Source rationalization reports that compare all data sources to each other
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